دلا ا. Identification of Deep Defects by Positron Annihilation Spectroscopy in Annealed GaAs Thin Films. Tishreen University Journal -Basic Sciences Series, [S. l.], v. 43, n. 1, 2021. Disponível em: https://journal.tishreen.edu.sy/index.php/bassnc/article/view/10470. Acesso em: 24 nov. 2024.