مطيافية إلكترون أوجيه لأفلام من أكسيد الزنك ZnO
Abstract
أجريت دراسة التركيب الكيميائي السطحي بواسطة مطيافية إلكترون أوجيه(AES) لطبقات من أكسيد الزنك المنماة بطريقة الترسيب الذري الطبقي. وقد تم تحديد العناصر المتوافرة على سطوح المواد، وتعيين التركيز الذري للعناصر على السطوح. لوحظت كمية صغيرة فقط من الكربون أو من مركبات الكربون، تم إزالتها بسهولة من خلال قذفها بايونات الأرغون. كما تبين أيضا أن قذف سطح العينة بايونات الأرغون لمدة طويلة يستنفذ الأكسجين منه جزئيا.
A study of surface chemical composition has been performed by using Auger Electron Spectroscopy (AES) for ZnO layers grown by Atomic Layer Deposition (ALD) procedure.Elements on surface of materials were identified,and, an atomic concentration of elements on surface was determinate. Onlysmall amount of carbon or carbon compounds detected, easily removed by argon ion sputtering. Also, long argon ion sputtering partly depleted surface of oxygen.
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