الاختبار التكنولوجي للأجهزة CCD الخطية
Abstract
يقدم هذا البحث نتائج قياس بعض البارامترات الخاصة الديناميكية للأجهزة CCD الخطية، ويطرح طرق بسيطة وسهلة لتحديد وقياس زمن التخزين وعامل الفقد الشحني.
في هذا البحث تم اقتراح طرق لقياس زمن التخزين وعامل الفقد الشحني في الجهاز الخطي نوع CCD المكون من 256 خلية حساسة للضوء، ويضم هذا اللاقط أربعة خطوط تأخير ضمن الشريحة المتكاملة، وهي معدة لتنفيذ عمليات المسح، والنقل وبعض تطبيقات معالجة الإشارة.
إن مادة البحث المستخدمة في الاختبار هي اللاقط الضوئي الخطي نوع CCD 256Pixels، المصمم والمصنع في قسم هندسة أنصاف النواقل، والإلكترونيات الدقيقة في الجامعة التقانية – صوفيا لأهداف البحث العلمي، وهو عبارة عن بنية شاملة متعددة التطبيقات، والوظائف، صممت لتعمل ضمن مجالين واسعين من مجالات الهندسة الإلكترونية، وهما مجال معالجة الإشارةSignal Processing ، ومجال اللواقط الضوئية للتصوير Image Photosensing.
This paper describes results of measurements of some specific parameters of Charge Coupled Devices (CCD). Our approach of quality control of CCD is demonstrated. The operation of CCD as a tool for technological test is discussed. The parameters carrier lifetime, storage time and surface states density are easily measured during the technological control by using CCD.
The material of this paper is a quality selection of a universal linear CCD, designed and fabricated in the Department of KTPPME at Technical University – Sofia for scientific research goals.
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